Beam-induced damage to thin specimens in an intense electron probe.
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Development and application of STEM for the biological sciencesThree-dimensional elemental mapping of phosphorus by quantitative electron spectroscopic tomography (QuEST).Graphene at the edge: stability and dynamics.Limitations of beam damage in electron spectroscopic tomography of embedded cells.Carbon nanotube-clamped metal atomic chain.Development of Electron Energy Loss Spectroscopy in the Biological SciencesRetro-fitting an older (S)TEM with two Cs aberration correctors for 80 kV and 60 kV operation.When will Low-Contrast Features be Visible in a STEM X-Ray Spectrum Image?Quantitative Analysis of Electron Beam Damage in Organic Thin FilmsObserving the morphology of single-layered embedded silicon nanocrystals by using temperature-stable TEM membranes.Distortion of DNA Origami on Graphene Imaged with Advanced TEM Techniques.Three-dimensional fabrication and characterisation of core-shell nano-columns using electron beam patterning of Ge-doped SiO2Electron energy loss spectroscopy on alkylated silicon nanocrystals
P2860
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P2860
Beam-induced damage to thin specimens in an intense electron probe.
description
2006 nî lūn-bûn
@nan
2006 թուականի Փետրուարին հրատարակուած գիտական յօդուած
@hyw
2006 թվականի փետրվարին հրատարակված գիտական հոդված
@hy
2006年の論文
@ja
2006年論文
@yue
2006年論文
@zh-hant
2006年論文
@zh-hk
2006年論文
@zh-mo
2006年論文
@zh-tw
2006年论文
@wuu
name
Beam-induced damage to thin specimens in an intense electron probe.
@ast
Beam-induced damage to thin specimens in an intense electron probe.
@en
type
label
Beam-induced damage to thin specimens in an intense electron probe.
@ast
Beam-induced damage to thin specimens in an intense electron probe.
@en
prefLabel
Beam-induced damage to thin specimens in an intense electron probe.
@ast
Beam-induced damage to thin specimens in an intense electron probe.
@en
P1476
Beam-induced damage to thin specimens in an intense electron probe
@en
P2093
Raymond F Egerton
P356
10.1017/S1431927606060065
P577
2006-02-01T00:00:00Z