Software image alignment for X-ray microtomography with submicrometre resolution using a SEM-based X-ray microscope.
about
Reliable automatic alignment of tomographic projection data by passive auto-focus.X-ray nanoprobes and diffraction-limited storage rings: opportunities and challenges of fluorescence tomography of biological specimens.Data-constrained microstructure characterization with multispectrum X-ray micro-CT.X-ray microcomputed tomography as a tool for the investigation of the biodistribution of magnetic nanoparticles.Rapid alignment of nanotomography data using joint iterative reconstruction and reprojection.Improved signal-to-noise ratio in laboratory-based phase contrast tomography.
P2860
Software image alignment for X-ray microtomography with submicrometre resolution using a SEM-based X-ray microscope.
description
2007 nî lūn-bûn
@nan
2007 թուականի Դեկտեմբերին հրատարակուած գիտական յօդուած
@hyw
2007 թվականի դեկտեմբերին հրատարակված գիտական հոդված
@hy
2007年の論文
@ja
2007年学术文章
@wuu
2007年学术文章
@zh-cn
2007年学术文章
@zh-hans
2007年学术文章
@zh-my
2007年学术文章
@zh-sg
2007年學術文章
@yue
name
Software image alignment for X ...... a SEM-based X-ray microscope.
@ast
Software image alignment for X ...... a SEM-based X-ray microscope.
@en
Software image alignment for X ...... a SEM-based X-ray microscope.
@nl
type
label
Software image alignment for X ...... a SEM-based X-ray microscope.
@ast
Software image alignment for X ...... a SEM-based X-ray microscope.
@en
Software image alignment for X ...... a SEM-based X-ray microscope.
@nl
prefLabel
Software image alignment for X ...... a SEM-based X-ray microscope.
@ast
Software image alignment for X ...... a SEM-based X-ray microscope.
@en
Software image alignment for X ...... a SEM-based X-ray microscope.
@nl
P2093
P2860
P1476
Software image alignment for X ...... g a SEM-based X-ray microscope
@en
P2093
Sheffield-Parker J
P2860
P304
P356
10.1111/J.1365-2818.2007.01857.X
P577
2007-12-01T00:00:00Z