An atomic force microscope tip designed to measure time-varying nanomechanical forces.
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Fundamental High-Speed Limits in Single-Molecule, Single-Cell, and Nanoscale Force SpectroscopiesChallenges and complexities of multifrequency atomic force microscopy in liquid environmentsIdentification of a Novel Parallel β-Strand Conformation within Molecular Monolayer of Amyloid PeptideMicrocantilever Actuation by Laser Induced Photoacoustic Waves.Dynamic nanoindentation by instrumented nanoindentation and force microscopy: a comparative review.Noncontact microrheology at acoustic frequencies using frequency-modulated atomic force microscopyImaging and three-dimensional reconstruction of chemical groups inside a protein complex using atomic force microscopy.Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus.Plasticity, elasticity, and adhesion energy of plant cell walls: nanometrology of lignin loss using atomic force microscopy.Functional recognition imaging using artificial neural networks: applications to rapid cellular identification via broadband electromechanical responsePlasmonic Microcantilever with Remarkably Enhanced Photothermal Responses.Towards early detection of cervical cancer: Fractal dimension of AFM images of human cervical epithelial cells at different stages of progression to cancer.Quasi in situ scanning force microscope with an automatic operated reaction chamber.Multi-frequency tapping-mode atomic force microscopy beyond three eigenmodes in ambient airAtomic force microscopy of biological membranesImproving image contrast and material discrimination with nonlinear response in bimodal atomic force microscopy.Multifrequency AFM: from origins to convergence.Coexistence of ribbon and helical fibrils originating from hIAPP(20-29) revealed by quantitative nanomechanical atomic force microscopy.Towards 4-dimensional atomic force spectroscopy using the spectral inversion method.Molecular characterization of organic electronic films.Biological AFM: where we come from--where we are--where we may go.The emergence of multifrequency force microscopy.Invited review article: combining scanning probe microscopy with optical spectroscopy for applications in biology and materials science.Mechanical characterization of polymeric thin films by atomic force microscopy based techniques.Quantitative biomolecular imaging by dynamic nanomechanical mapping.Nanomechanics of Cells and Biomaterials Studied by Atomic Force Microscopy.Rapid quantitative chemical mapping of surfaces with sub-2 nm resolution.Fast Stiffness Mapping of Cells Using High-Bandwidth Atomic Force Microscopy.Unlocking higher harmonics in atomic force microscopy with gentle interactionsNanomechanical properties of α-synuclein amyloid fibrils: a comparative study by nanoindentation, harmonic force microscopy, and Peakforce QNM.Imaging modes of atomic force microscopy for application in molecular and cell biology.Single cycle and transient force measurements in dynamic atomic force microscopy.Generalized Hertz model for bimodal nanomechanical mappingHigh-resolution nanomechanical analysis of suspended electrospun silk fibers with the torsional harmonic atomic force microscopeDNA nanomechanics allows direct digital detection of complementary DNA and microRNA targets.Direct monitoring of opto-mechanical switching of self-assembled monolayer films containing the azobenzene group.Probing viscoelastic response of soft material surfaces at the nanoscale.Optimization of phase contrast in bimodal amplitude modulation AFM.Visualization of polar nanoregions in lead-free relaxors via piezoresponse force microscopy in torsional dual AC resonance tracking mode.Role of Surface Roughness in Hysteresis during Adhesive Elastic Contact.
P2860
Q27340375-56982912-B233-4896-B423-08EFE26A3F07Q28658319-B26A5A4F-42C7-4DC6-B11E-D563938B8701Q28821551-EABA05DF-AC78-4919-89DB-92721D35E100Q30392055-912E34DE-D277-4C20-AD5B-CE9F5E6D22A3Q30445491-79475225-65ED-4317-8A5D-BAF43D7978AFQ30460487-A929AA3E-F2A4-47F1-BF94-0FB7DF01AC52Q30650215-0BB2381E-F69C-4187-9733-D580B089E7ACQ31054448-CD4FF11A-A892-428D-BE49-DA1515561D0AQ33670132-4D7019F3-D630-4B7C-B819-E69FB2CA06CAQ33757014-396ABA3F-200C-4C52-B821-735776CD1C9BQ33880997-D0CA94E0-C58E-4D74-A566-0B6791E8A263Q33919581-FBEA91BC-4220-4302-89E9-5308404E9A45Q34086756-CD6FF8B7-47E8-48CF-9B92-B5C831190DCFQ34463672-9D390C75-45CC-4BBD-872D-52B1AD470674Q34929071-DDE86C22-7047-4063-9914-414B16BBBC47Q35139282-9C755E4B-9193-4CD0-8FE4-B99B4433B688Q36342019-A8A67610-D32E-437D-9010-69E569573FF2Q36637254-A48F5711-C697-459E-907A-1EC7F1405FB1Q36680185-8722D1AD-1D48-498C-ADCB-5DEB1728B72DQ37784478-ECD46128-910B-4590-A446-72CB05E44386Q37866727-B1A11BEE-647F-4D15-B942-67ADAEEA76D7Q37998903-487C0265-DA48-40C5-AE57-E7547D1D8FA9Q38023474-340EB3D9-661D-4E08-9E08-9F8C1DBB481FQ38050983-F8D8BAA2-5C0E-4B36-A7FE-F66352B32939Q38237965-7635AD51-E5C1-497A-90A0-9DC51CF01439Q38551979-6EB11158-0B87-4879-B1CC-80866968B5BCQ38876764-568BCC68-CF4F-4D8E-A7F1-31756FB7961FQ38944229-C3F0C0D8-DFB8-43B3-8534-C1D0610A0A06Q38967646-582BDE6B-9B41-442B-A158-1B6D6E5E9E07Q38993396-6E2326A4-C93D-429A-BDD0-0FE7E0E102FAQ39223922-6A27AA10-717F-47CC-985D-4CB5EA40CED3Q39343844-0310DF25-E566-4F23-9457-7125FCE5C844Q39467784-6C2E9E31-884C-49CE-84CD-B082778ED714Q39907369-2C14CC73-6E24-45FB-BF18-9F80F9514688Q39911995-E6654462-FF37-4B96-B121-C13C3402D830Q40374119-222260DE-DD3D-4457-9D1D-A443F67C2DADQ40417445-1F77BD89-E33F-4BDB-9FCB-F77F4AE31974Q40794593-B8812EBB-8021-4FA4-BB9B-8C122978FF2EQ40802320-44E9A589-7DF9-459B-B5CE-C51A6FC3F3D0Q41193922-5DEED780-90D2-4907-AD50-976A0FE742FA
P2860
An atomic force microscope tip designed to measure time-varying nanomechanical forces.
description
2007 nî lūn-bûn
@nan
2007 թուականի Յուլիսին հրատարակուած գիտական յօդուած
@hyw
2007 թվականի հուլիսին հրատարակված գիտական հոդված
@hy
2007年の論文
@ja
2007年論文
@yue
2007年論文
@zh-hant
2007年論文
@zh-hk
2007年論文
@zh-mo
2007年論文
@zh-tw
2007年论文
@wuu
name
An atomic force microscope tip designed to measure time-varying nanomechanical forces.
@ast
An atomic force microscope tip designed to measure time-varying nanomechanical forces.
@en
type
label
An atomic force microscope tip designed to measure time-varying nanomechanical forces.
@ast
An atomic force microscope tip designed to measure time-varying nanomechanical forces.
@en
prefLabel
An atomic force microscope tip designed to measure time-varying nanomechanical forces.
@ast
An atomic force microscope tip designed to measure time-varying nanomechanical forces.
@en
P2093
P356
P1476
An atomic force microscope tip designed to measure time-varying nanomechanical forces.
@en
P2093
Calvin F Quate
Chanmin Su
Olav Solgaard
Ozgur Sahin
Sergei Magonov
P2888
P304
P356
10.1038/NNANO.2007.226
P407
P577
2007-07-29T00:00:00Z
P5875
P6179
1032153122