Magnification variations due to illumination curvature and object defocus in transmission electron microscopy.
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Single particle cryo-electron microscopy and 3-D reconstruction of virusesContrast transfer function correction applied to cryo-electron tomography and sub-tomogram averaging.Limiting factors in atomic resolution cryo electron microscopy: no simple tricks.Dependence of the measured size of the objects on the parameters of the transmitted light source in video measurement microscopy.
P2860
Magnification variations due to illumination curvature and object defocus in transmission electron microscopy.
description
2005 nî lūn-bûn
@nan
2005 թուականի Հոկտեմբերին հրատարակուած գիտական յօդուած
@hyw
2005 թվականի հոտեմբերին հրատարակված գիտական հոդված
@hy
2005年の論文
@ja
2005年論文
@yue
2005年論文
@zh-hant
2005年論文
@zh-hk
2005年論文
@zh-mo
2005年論文
@zh-tw
2005年论文
@wuu
name
Magnification variations due t ...... nsmission electron microscopy.
@ast
Magnification variations due t ...... nsmission electron microscopy.
@en
type
label
Magnification variations due t ...... nsmission electron microscopy.
@ast
Magnification variations due t ...... nsmission electron microscopy.
@en
prefLabel
Magnification variations due t ...... nsmission electron microscopy.
@ast
Magnification variations due t ...... nsmission electron microscopy.
@en
P356
P1433
P1476
Magnification variations due t ...... nsmission electron microscopy.
@en
P2093
Gijs van Duinen
Marin van Heel
P304
P356
10.1364/OPEX.13.009085
P407
P577
2005-10-01T00:00:00Z