Accurate noncontact calibration of colloidal probe sensitivities in atomic force microscopy.
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Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope.Stability enhancement of an atomic force microscope for long-term force measurement including cantilever modification for whole cell deformation.Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers.
P2860
Accurate noncontact calibration of colloidal probe sensitivities in atomic force microscopy.
description
2009 nî lūn-bûn
@nan
2009 թուականի Յունիսին հրատարակուած գիտական յօդուած
@hyw
2009 թվականի հունիսին հրատարակված գիտական հոդված
@hy
2009年の論文
@ja
2009年論文
@yue
2009年論文
@zh-hant
2009年論文
@zh-hk
2009年論文
@zh-mo
2009年論文
@zh-tw
2009年论文
@wuu
name
Accurate noncontact calibratio ...... es in atomic force microscopy.
@ast
Accurate noncontact calibratio ...... es in atomic force microscopy.
@en
type
label
Accurate noncontact calibratio ...... es in atomic force microscopy.
@ast
Accurate noncontact calibratio ...... es in atomic force microscopy.
@en
prefLabel
Accurate noncontact calibratio ...... es in atomic force microscopy.
@ast
Accurate noncontact calibratio ...... es in atomic force microscopy.
@en
P2860
P356
P1476
Accurate noncontact calibratio ...... es in atomic force microscopy.
@en
P2093
Gordon A Shaw
Jon R Pratt
P2860
P304
P356
10.1063/1.3152335
P407
P577
2009-06-01T00:00:00Z