about
The FAST module: an add-on unit for driving commercial scanning probe microscopes at video rate and beyond.Design of a high-speed electrochemical scanning tunneling microscope.Separate-type scanner and wideband high-voltage amplifier for atomic-resolution and high-speed atomic force microscopy.Piezoelectric bimorph-based scanner in the tip-scan mode for high speed atomic force microscope.A subsurface add-on for standard atomic force microscopes.A miniaturized, high frequency mechanical scanner for high speed atomic force microscope using suspension on dynamically determined points.An intelligent control scheme for precise tip-motion control in atomic force microscopy.Note: High-speed Z tip scanner with screw cantilever holding mechanism for atomic-resolution atomic force microscopy in liquid.Tunable mechanical coupling between driven microelectromechanical resonators
P2860
Q33922038-43626372-62DA-42F5-8741-D8AE87AFCF93Q34609790-36A05F67-E9A4-40A8-872F-09D286B4282DQ34699106-78C0EA11-1271-4AF8-82D2-5E27A4AD2262Q34978788-7BE7A90A-F34C-4CFE-B217-66E425032DE5Q35592410-1085600E-EEAF-4CED-99F6-64992A18304EQ35858155-E50DE7D0-9369-4815-9E5B-802217A9E114Q40297283-BFCEBE0D-8994-4780-96AD-C42BDA71EF0EQ53348823-1AD3C339-3AC4-4189-87FF-FAEB4B2A7816Q59167835-00E30593-FFE3-41C3-A0A0-32C90B09E80C
P2860
description
2010 nî lūn-bûn
@nan
2010 թուականի Մարտին հրատարակուած գիտական յօդուած
@hyw
2010 թվականի մարտին հրատարակված գիտական հոդված
@hy
2010年の論文
@ja
2010年論文
@yue
2010年論文
@zh-hant
2010年論文
@zh-hk
2010年論文
@zh-mo
2010年論文
@zh-tw
2010年论文
@wuu
name
MEMS-based fast scanning probe microscopes.
@ast
MEMS-based fast scanning probe microscopes.
@en
MEMS-based fast scanning probe microscopes.
@nl
type
label
MEMS-based fast scanning probe microscopes.
@ast
MEMS-based fast scanning probe microscopes.
@en
MEMS-based fast scanning probe microscopes.
@nl
prefLabel
MEMS-based fast scanning probe microscopes.
@ast
MEMS-based fast scanning probe microscopes.
@en
MEMS-based fast scanning probe microscopes.
@nl
P2093
P1433
P1476
MEMS-based fast scanning probe microscopes
@en
P2093
E C M Disseldorp
G H Wortel
M B S Hesselberth
T H Oosterkamp
W M van Spengen
P304
P356
10.1016/J.ULTRAMIC.2010.02.018
P577
2010-03-07T00:00:00Z