Shearforce-based constant-distance scanning electrochemical microscopy as fabrication tool for needle-type carbon-fiber nanoelectrodes.
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Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical MicroscopyRecent advancements in nanoelectrodes and nanopipettes used in combined scanning electrochemical microscopy techniques.Multifunctional carbon nanoelectrodes fabricated by focused ion beam milling.Scanning electrochemical microscopy in the 21st century. Update 1: five years after
P2860
Shearforce-based constant-distance scanning electrochemical microscopy as fabrication tool for needle-type carbon-fiber nanoelectrodes.
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2010 nî lūn-bûn
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2010 թուականի Յուլիսին հրատարակուած գիտական յօդուած
@hyw
2010 թվականի հուլիսին հրատարակված գիտական հոդված
@hy
2010年の論文
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2010年論文
@yue
2010年論文
@zh-hant
2010年論文
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2010年論文
@zh-mo
2010年論文
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2010年论文
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name
Shearforce-based constant-dist ...... e carbon-fiber nanoelectrodes.
@ast
Shearforce-based constant-dist ...... e carbon-fiber nanoelectrodes.
@en
type
label
Shearforce-based constant-dist ...... e carbon-fiber nanoelectrodes.
@ast
Shearforce-based constant-dist ...... e carbon-fiber nanoelectrodes.
@en
prefLabel
Shearforce-based constant-dist ...... e carbon-fiber nanoelectrodes.
@ast
Shearforce-based constant-dist ...... e carbon-fiber nanoelectrodes.
@en
P356
P1433
P1476
Shearforce-based constant-dist ...... e carbon-fiber nanoelectrodes.
@en
P2093
Albert Schulte
Emad Mohamed Hussien
P304
P356
10.1021/AC100738B
P407
P577
2010-07-01T00:00:00Z