Depth profiling of nanometer coatings by low temperature plasma probe combined with inductively coupled plasma mass spectrometry.
about
Characterisation of a micro-plasma for ambient mass spectrometry imaging.Detection of layer-by-layer self-assembly multilayer films by low-temperature plasma mass spectrometry.Dielectric barrier discharges in analytical chemistry.Development of dielectric-barrier-discharge ionization.Comparison of three plasma sources for ambient desorption/ionization mass spectrometry.Analysis of personal care products on model skin surfaces using DESI and PADI ambient mass spectrometry.
P2860
Depth profiling of nanometer coatings by low temperature plasma probe combined with inductively coupled plasma mass spectrometry.
description
2010 nî lūn-bûn
@nan
2010 թուականի Յուլիսին հրատարակուած գիտական յօդուած
@hyw
2010 թվականի հուլիսին հրատարակված գիտական հոդված
@hy
2010年の論文
@ja
2010年論文
@yue
2010年論文
@zh-hant
2010年論文
@zh-hk
2010年論文
@zh-mo
2010年論文
@zh-tw
2010年论文
@wuu
name
Depth profiling of nanometer c ...... pled plasma mass spectrometry.
@ast
Depth profiling of nanometer c ...... pled plasma mass spectrometry.
@en
type
label
Depth profiling of nanometer c ...... pled plasma mass spectrometry.
@ast
Depth profiling of nanometer c ...... pled plasma mass spectrometry.
@en
prefLabel
Depth profiling of nanometer c ...... pled plasma mass spectrometry.
@ast
Depth profiling of nanometer c ...... pled plasma mass spectrometry.
@en
P2093
P356
P1433
P1476
Depth profiling of nanometer c ...... pled plasma mass spectrometry.
@en
P2093
Biekesailike Kuermaiti
Guojun Han
Sichun Zhang
Xinrong Zhang
P304
P356
10.1021/AC101147T
P407
P577
2010-07-01T00:00:00Z