Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy.
about
Scanning transmission X-ray microscopy probe for in situ mechanism study of graphene-oxide-based resistive random access memory.Revealing the role of catalysts in carbon nanotubes and nanofibers by scanning transmission X-ray microscopy.Synchrotron soft X-ray absorption spectroscopy study of carbon and silicon nanostructures for energy applications.X-ray absorption spectroscopy by full-field X-ray microscopy of a thin graphite flake: Imaging and electronic structure via the carbon K-edge.Nano-beam and nano-target effects in ion radiation.
P2860
Measuring point defect density in individual carbon nanotubes using polarization-dependent X-ray microscopy.
description
2010 nî lūn-bûn
@nan
2010 թուականի Օգոստոսին հրատարակուած գիտական յօդուած
@hyw
2010 թվականի օգոստոսին հրատարակված գիտական հոդված
@hy
2010年の論文
@ja
2010年論文
@yue
2010年論文
@zh-hant
2010年論文
@zh-hk
2010年論文
@zh-mo
2010年論文
@zh-tw
2010年论文
@wuu
name
Measuring point defect density ...... on-dependent X-ray microscopy.
@ast
Measuring point defect density ...... on-dependent X-ray microscopy.
@en
type
label
Measuring point defect density ...... on-dependent X-ray microscopy.
@ast
Measuring point defect density ...... on-dependent X-ray microscopy.
@en
prefLabel
Measuring point defect density ...... on-dependent X-ray microscopy.
@ast
Measuring point defect density ...... on-dependent X-ray microscopy.
@en
P2093
P50
P356
P1433
P1476
Measuring point defect density ...... on-dependent X-ray microscopy.
@en
P2093
Adam P Hitchcock
Alexandre Felten
Ebrahim Najafi
Jean-Jacques Pireaux
Michal Gulas
Xavier Gillon
P304
P356
10.1021/NN1002248
P407
P577
2010-08-01T00:00:00Z