Experimental observation of contact mode cantilever dynamics with nanosecond resolution.
about
Opportunities in high-speed atomic force microscopy.Gaining insight into the physics of dynamic atomic force microscopy in complex environments using the VEDA simulator.Improving the signal-to-noise ratio of high-speed contact mode atomic force microscopy.Ionic solutions of two-dimensional materials.A calibration method for the higher modes of a micro-mechanical cantileverHigh-speed atomic force microscopy for materials science
P2860
Experimental observation of contact mode cantilever dynamics with nanosecond resolution.
description
2011 nî lūn-bûn
@nan
2011 թուականի Ապրիլին հրատարակուած գիտական յօդուած
@hyw
2011 թվականի ապրիլին հրատարակված գիտական հոդված
@hy
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
name
Experimental observation of contact mode cantilever dynamics with nanosecond resolution.
@ast
Experimental observation of contact mode cantilever dynamics with nanosecond resolution.
@en
type
label
Experimental observation of contact mode cantilever dynamics with nanosecond resolution.
@ast
Experimental observation of contact mode cantilever dynamics with nanosecond resolution.
@en
prefLabel
Experimental observation of contact mode cantilever dynamics with nanosecond resolution.
@ast
Experimental observation of contact mode cantilever dynamics with nanosecond resolution.
@en
P2093
P2860
P356
P1476
Experimental observation of contact mode cantilever dynamics with nanosecond resolution.
@en
P2093
P2860
P304
P356
10.1063/1.3575321
P407
P577
2011-04-01T00:00:00Z