Combining scanning probe microscopy and x-ray spectroscopy.
about
An easy-to-implement filter for separating photo-excited signals from topography in scanning tunneling microscopy.Versatile atomic force microscopy setup combined with micro-focused X-ray beam.Custom AFM for X-ray beamlines: in situ biological investigations under physiological conditions.Local X-ray magnetic circular dichroism study of Fe/Cu(111) using a tunneling smart tip.Spatial resolution of confocal XRF technique using capillary optics.
P2860
Combining scanning probe microscopy and x-ray spectroscopy.
description
2011 nî lūn-bûn
@nan
2011 թուականի Ապրիլին հրատարակուած գիտական յօդուած
@hyw
2011 թվականի ապրիլին հրատարակված գիտական հոդված
@hy
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
name
Combining scanning probe microscopy and x-ray spectroscopy.
@ast
Combining scanning probe microscopy and x-ray spectroscopy.
@en
type
label
Combining scanning probe microscopy and x-ray spectroscopy.
@ast
Combining scanning probe microscopy and x-ray spectroscopy.
@en
prefLabel
Combining scanning probe microscopy and x-ray spectroscopy.
@ast
Combining scanning probe microscopy and x-ray spectroscopy.
@en
P2093
P356
P1476
Combining scanning probe microscopy and x-ray spectroscopy.
@en
P2093
Alexei Erko
Aniouar Bjeoumikhov
Brahim Dahmani
Carole Fauquet
Daniel Pailharey
Didier Tonneau
Franck Jandard
Juris Purans
Maël Dehlinger
P2860
P2888
P356
10.1186/1556-276X-6-308
P577
2011-04-07T00:00:00Z
P6179
1043272749