Characterization of composition C4 explosives using time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy.
about
Automated correlation and classification of secondary ion mass spectrometry images using a k-means cluster method.Combined use of direct analysis in real-time/Orbitrap mass spectrometry and micro-Raman spectroscopy for the comprehensive characterization of real explosive samples.Solution and Solid Hexahydro-1,3,5-trinitro-1,3,5-triazine (RDX) Ultraviolet (UV) 229 nm Photochemistry.Recent advances in ambient mass spectrometry of trace explosives.
P2860
Characterization of composition C4 explosives using time-of-flight secondary ion mass spectrometry and X-ray photoelectron spectroscopy.
description
2010 nî lūn-bûn
@nan
2010 թուականի Սեպտեմբերին հրատարակուած գիտական յօդուած
@hyw
2010 թվականի սեպտեմբերին հրատարակված գիտական հոդված
@hy
2010年の論文
@ja
2010年論文
@yue
2010年論文
@zh-hant
2010年論文
@zh-hk
2010年論文
@zh-mo
2010年論文
@zh-tw
2010年论文
@wuu
name
Characterization of compositio ...... ay photoelectron spectroscopy.
@ast
Characterization of compositio ...... ay photoelectron spectroscopy.
@en
Characterization of compositio ...... ay photoelectron spectroscopy.
@nl
type
label
Characterization of compositio ...... ay photoelectron spectroscopy.
@ast
Characterization of compositio ...... ay photoelectron spectroscopy.
@en
Characterization of compositio ...... ay photoelectron spectroscopy.
@nl
prefLabel
Characterization of compositio ...... ay photoelectron spectroscopy.
@ast
Characterization of compositio ...... ay photoelectron spectroscopy.
@en
Characterization of compositio ...... ay photoelectron spectroscopy.
@nl
P2093
P356
P1433
P1476
Characterization of compositio ...... ay photoelectron spectroscopy.
@en
P2093
Albert J Fahey
Bruce A Benner
Christine M Mahoney
Kristen L Steffens
Richard T Lareau
P304
P356
10.1021/AC101116R
P407
P577
2010-09-01T00:00:00Z