Noise Characterization of Polycrystalline Silicon Thin Film Transistors for X-ray Imagers Based on Active Pixel Architectures
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Noise Characterization of Polycrystalline Silicon Thin Film Transistors for X-ray Imagers Based on Active Pixel Architectures
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2008 nî lūn-bûn
@nan
2008 թուականի Յունուարին հրատարակուած գիտական յօդուած
@hyw
2008 թվականի հունվարին հրատարակված գիտական հոդված
@hy
2008年の論文
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2008年論文
@yue
2008年論文
@zh-hant
2008年論文
@zh-hk
2008年論文
@zh-mo
2008年論文
@zh-tw
2008年论文
@wuu
name
Noise Characterization of Poly ...... on Active Pixel Architectures
@ast
Noise Characterization of Poly ...... on Active Pixel Architectures
@en
Noise Characterization of Poly ...... on Active Pixel Architectures
@nl
type
label
Noise Characterization of Poly ...... on Active Pixel Architectures
@ast
Noise Characterization of Poly ...... on Active Pixel Architectures
@en
Noise Characterization of Poly ...... on Active Pixel Architectures
@nl
prefLabel
Noise Characterization of Poly ...... on Active Pixel Architectures
@ast
Noise Characterization of Poly ...... on Active Pixel Architectures
@en
Noise Characterization of Poly ...... on Active Pixel Architectures
@nl
P2093
P356
P1476
Noise Characterization of Poly ...... on Active Pixel Architectures
@en
P2093
P304
P356
10.1557/PROC-1066-A19-03
P577
2008-01-01T00:00:00Z