Atomic-resolution scanning transmission electron microscopy through 50-nm-thick silicon nitride membranes.
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Silicon nitride windows for electron microscopy of whole cellsOptimized deconvolution for maximum axial resolution in three-dimensional aberration-corrected scanning transmission electron microscopy.Recent developments of the in situ wet cell technology for transmission electron microscopies.Through a Window, Brightly: A Review of Selected Nanofabricated Thin-Film Platforms for Spectroscopy, Imaging, and Detection.A MEMS-based heating holder for the direct imaging of simultaneous in-situ heating and biasing experiments in scanning/transmission electron microscopes.The probe profile and lateral resolution of scanning transmission electron microscopy of thick specimens
P2860
Atomic-resolution scanning transmission electron microscopy through 50-nm-thick silicon nitride membranes.
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2011 nî lūn-bûn
@nan
2011 թուականի Փետրուարին հրատարակուած գիտական յօդուած
@hyw
2011 թվականի փետրվարին հրատարակված գիտական հոդված
@hy
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
name
Atomic-resolution scanning tra ...... ick silicon nitride membranes.
@ast
Atomic-resolution scanning tra ...... ick silicon nitride membranes.
@en
Atomic-resolution scanning tra ...... ick silicon nitride membranes.
@nl
type
label
Atomic-resolution scanning tra ...... ick silicon nitride membranes.
@ast
Atomic-resolution scanning tra ...... ick silicon nitride membranes.
@en
Atomic-resolution scanning tra ...... ick silicon nitride membranes.
@nl
prefLabel
Atomic-resolution scanning tra ...... ick silicon nitride membranes.
@ast
Atomic-resolution scanning tra ...... ick silicon nitride membranes.
@en
Atomic-resolution scanning tra ...... ick silicon nitride membranes.
@nl
P2093
P2860
P356
P1476
Atomic-resolution scanning tra ...... ick silicon nitride membranes.
@en
P2093
Hendrix Demers
Niels de Jonge
Ranjan Ramachandra
P2860
P356
10.1063/1.3561758
P407
P577
2011-02-01T00:00:00Z