Minimizing electrostatic charging of an aperture used to produce in-focus phase contrast in the TEM.
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Invited review article: Methods for imaging weak-phase objects in electron microscopyCryoEM at IUCrJ: a new eraGeneralization of the Matsumoto-Tonomura approximation for the phase shift within an open aperture.Phage-host interplay: examples from tailed phages and Gram-negative bacterial pathogens.In-focus electrostatic Zach phase plate imaging for transmission electron microscopy with tunable phase contrast of frozen hydrated biological samples.
P2860
Minimizing electrostatic charging of an aperture used to produce in-focus phase contrast in the TEM.
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2013 nî lūn-bûn
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2013 թուականի Յունիսին հրատարակուած գիտական յօդուած
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2013 թվականի հունիսին հրատարակված գիտական հոդված
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2013年の論文
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2013年論文
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2013年論文
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2013年論文
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2013年論文
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2013年論文
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2013年论文
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Minimizing electrostatic charg ...... cus phase contrast in the TEM.
@ast
Minimizing electrostatic charg ...... cus phase contrast in the TEM.
@en
Minimizing electrostatic charg ...... cus phase contrast in the TEM.
@nl
type
label
Minimizing electrostatic charg ...... cus phase contrast in the TEM.
@ast
Minimizing electrostatic charg ...... cus phase contrast in the TEM.
@en
Minimizing electrostatic charg ...... cus phase contrast in the TEM.
@nl
prefLabel
Minimizing electrostatic charg ...... cus phase contrast in the TEM.
@ast
Minimizing electrostatic charg ...... cus phase contrast in the TEM.
@en
Minimizing electrostatic charg ...... cus phase contrast in the TEM.
@nl
P2093
P2860
P1433
P1476
Minimizing electrostatic charg ...... cus phase contrast in the TEM.
@en
P2093
Andreas K Schmid
Bart Buijsse
David M Larson
Dieter Typke
Kenneth H Downing
Radostin Danev
Robert M Glaeser
Roseann Csencsits
P2860
P356
10.1016/J.ULTRAMIC.2013.05.023
P577
2013-06-08T00:00:00Z