Thermal measurement. Nanoscale temperature mapping in operating microelectronic devices.
about
Femtosecond electron imaging of defect-modulated phonon dynamics.Temperature mapping of operating nanoscale devices by scanning probe thermometry.Performance of Nano-Submicron-Stripe Pd Thin-Film Temperature Sensors.Electron transfer across a thermal gradient.In situ thermomechanical testing methods for micro/nano-scale materials.A MEMS-based heating holder for the direct imaging of simultaneous in-situ heating and biasing experiments in scanning/transmission electron microscopes.NaYF4:Er3+,Yb3+/SiO2 Core/Shell Upconverting Nanocrystals for Luminescence Thermometry up to 900 K.Geometric Shape Induced Small Change of Seebeck Coefficient in Bulky Metallic Wires.Real-Time Two-Dimensional Mapping of Relative Local Surface Temperatures with a Thin-Film Sensor Array.Metal nanospheres under intense continuous-wave illumination: A unique case of nonperturbative nonlinear nanophotonics.High Spatial Resolution Imaging of Transient Thermal Events Using Materials with Thermal Memory.Nanoscale thermal imaging of dissipation in quantum systems.Downsized Sheath-Core Conducting Fibers for Weavable Superelastic Wires, Biosensors, Supercapacitors, and Strain Sensors.Boosting the sensitivity of Nd(3+)-based luminescent nanothermometers.Plasmon dissipation in gapped graphene open systems at finite temperature
P2860
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P2860
Thermal measurement. Nanoscale temperature mapping in operating microelectronic devices.
description
2015 nî lūn-bûn
@nan
2015年の論文
@ja
2015年論文
@yue
2015年論文
@zh-hant
2015年論文
@zh-hk
2015年論文
@zh-mo
2015年論文
@zh-tw
2015年论文
@wuu
2015年论文
@zh
2015年论文
@zh-cn
name
Thermal measurement. Nanoscale temperature mapping in operating microelectronic devices.
@ast
Thermal measurement. Nanoscale temperature mapping in operating microelectronic devices.
@en
type
label
Thermal measurement. Nanoscale temperature mapping in operating microelectronic devices.
@ast
Thermal measurement. Nanoscale temperature mapping in operating microelectronic devices.
@en
prefLabel
Thermal measurement. Nanoscale temperature mapping in operating microelectronic devices.
@ast
Thermal measurement. Nanoscale temperature mapping in operating microelectronic devices.
@en
P2093
P2860
P356
P1433
P1476
Thermal measurement. Nanoscale temperature mapping in operating microelectronic devices.
@en
P2093
Matthew Mecklenburg
Rohan Dhall
Shaul Aloni
Stephen B Cronin
William A Hubbard
P2860
P304
P356
10.1126/SCIENCE.AAA2433
P407
P577
2015-02-01T00:00:00Z