Fast IR laser mapping ellipsometry for the study of functional organic thin films.
about
An ellipsometric approach towards the description of inhomogeneous polymer-based Langmuir layers.Characterization of Dielectric Nanocomposites with Electrostatic Force Microscopy.Accurate Molecular Orientation Analysis Using Infrared p-Polarized Multiple-Angle Incidence Resolution Spectrometry (pMAIRS) Considering the Refractive Index of the Thin Film Sample.
P2860
Fast IR laser mapping ellipsometry for the study of functional organic thin films.
description
2015 nî lūn-bûn
@nan
2015年の論文
@ja
2015年論文
@yue
2015年論文
@zh-hant
2015年論文
@zh-hk
2015年論文
@zh-mo
2015年論文
@zh-tw
2015年论文
@wuu
2015年论文
@zh
2015年论文
@zh-cn
name
Fast IR laser mapping ellipsometry for the study of functional organic thin films.
@ast
Fast IR laser mapping ellipsometry for the study of functional organic thin films.
@en
type
label
Fast IR laser mapping ellipsometry for the study of functional organic thin films.
@ast
Fast IR laser mapping ellipsometry for the study of functional organic thin films.
@en
prefLabel
Fast IR laser mapping ellipsometry for the study of functional organic thin films.
@ast
Fast IR laser mapping ellipsometry for the study of functional organic thin films.
@en
P2093
P2860
P356
P1433
P1476
Fast IR laser mapping ellipsometry for the study of functional organic thin films.
@en
P2093
Andreas Furchner
Guoguang Sun
Jörg Rappich
P2860
P304
P356
10.1039/C4AN01853B
P577
2015-03-01T00:00:00Z