about
50-nm-resolution full-field X-ray microscope without chromatic aberration using total-reflection imaging mirrorsPerfect X-ray focusing via fitting corrective glasses to aberrated optics.Simulating and optimizing compound refractive lens-based X-ray microscopes.Interlaced zone plate optics for hard X-ray imaging in the 10 nm range.Ellipsoidal mirror for two-dimensional 100-nm focusing in hard X-ray region.Artifact mitigation of ptychography integrated with on-the-fly scanning probe microscopyDevelopment and characterization of monolithic multilayer Laue lens nanofocusing opticsMultilayer Laue Lens: A Brief History and Current StatusX-ray Fluorescence Nanotomography of Single Bacteria with a Sub-15 nm BeamPETRA IV: the ultralow-emittance source project at DESYMultiscale 3D characterization with dark-field x-ray microscopy
P2860
Q30845181-5AA89C9A-FC7D-4013-AABC-5749D7F80205Q36293627-DC6A6CBE-6A2A-4D4F-AB20-FF27605E8352Q42319312-DFF8E345-F969-4663-81FA-F3E987A81C11Q46664623-8CA5996C-2BBE-44A0-BAC8-94EB775A6236Q47097051-E304F671-1960-4F7E-8929-391FFCB12978Q57530165-881328BA-67BB-4F96-B2F5-85D123AAEB32Q57530195-4F9F0843-91FD-4A02-B605-36061DDC7AC7Q57530201-14EACF88-B20C-4DBD-B48B-3506DC20D1B8Q58759608-8B64B444-7890-4F1C-9CD9-69468A493E1BQ58792127-F7317641-B3F3-4DEB-8806-2C7D3D3B6084Q58820450-0EA44C2A-E53E-4EBA-B863-72C9247DA748
P2860
description
2015 nî lūn-bûn
@nan
2015年の論文
@ja
2015年論文
@yue
2015年論文
@zh-hant
2015年論文
@zh-hk
2015年論文
@zh-mo
2015年論文
@zh-tw
2015年论文
@wuu
2015年论文
@zh
2015年论文
@zh-cn
name
High numerical aperture multilayer Laue lenses.
@ast
High numerical aperture multilayer Laue lenses.
@en
type
label
High numerical aperture multilayer Laue lenses.
@ast
High numerical aperture multilayer Laue lenses.
@en
prefLabel
High numerical aperture multilayer Laue lenses.
@ast
High numerical aperture multilayer Laue lenses.
@en
P2093
P2860
P50
P356
P1433
P1476
High numerical aperture multilayer Laue lenses
@en
P2093
Alke Meents
Andrew Aquila
Andrzej Andrejczuk
David Pennicard
Dominik Oberthuer
Heinz Graafsma
Jacek Krzywinski
Miriam Barthelmess
Richard J Bean
P2860
P2888
P356
10.1038/SREP09892
P407
P577
2015-06-01T00:00:00Z