Subwavelength imaging through ion-beam-induced upconversion.
about
Thin film depth profiling by ion beam analysis.Ultra-Wideband Multi-Dye-Sensitized Upconverting Nanoparticles for Information Security Application.Designing Upconversion Nanocrystals Capable of 745 nm Sensitization and 803 nm Emission for Deep-Tissue Imaging.Nonlinear spectral and lifetime management in upconversion nanoparticles by controlling energy distribution.
P2860
Subwavelength imaging through ion-beam-induced upconversion.
description
2015 nî lūn-bûn
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2015年の論文
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2015年論文
@yue
2015年論文
@zh-hant
2015年論文
@zh-hk
2015年論文
@zh-mo
2015年論文
@zh-tw
2015年论文
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2015年论文
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2015年论文
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name
Subwavelength imaging through ion-beam-induced upconversion.
@ast
Subwavelength imaging through ion-beam-induced upconversion.
@en
type
label
Subwavelength imaging through ion-beam-induced upconversion.
@ast
Subwavelength imaging through ion-beam-induced upconversion.
@en
prefLabel
Subwavelength imaging through ion-beam-induced upconversion.
@ast
Subwavelength imaging through ion-beam-induced upconversion.
@en
P2093
P2860
P50
P356
P1476
Subwavelength imaging through ion-beam-induced upconversion
@en
P2093
Ce-Belle Chen
Frank Watt
Hong Qi Tan
Yuhai Zhang
P2860
P2888
P356
10.1038/NCOMMS9832
P407
P577
2015-11-12T00:00:00Z