An in situ atomic force microscope for normal-incidence nanofocus X-ray experiments.
about
An in situ atomic force microscope for normal-incidence nanofocus X-ray experiments.
description
2016 nî lūn-bûn
@nan
2016年の論文
@ja
2016年論文
@yue
2016年論文
@zh-hant
2016年論文
@zh-hk
2016年論文
@zh-mo
2016年論文
@zh-tw
2016年论文
@wuu
2016年论文
@zh
2016年论文
@zh-cn
name
An in situ atomic force microscope for normal-incidence nanofocus X-ray experiments.
@ast
An in situ atomic force microscope for normal-incidence nanofocus X-ray experiments.
@en
type
label
An in situ atomic force microscope for normal-incidence nanofocus X-ray experiments.
@ast
An in situ atomic force microscope for normal-incidence nanofocus X-ray experiments.
@en
prefLabel
An in situ atomic force microscope for normal-incidence nanofocus X-ray experiments.
@ast
An in situ atomic force microscope for normal-incidence nanofocus X-ray experiments.
@en
P2093
P2860
P50
P1476
An in situ atomic force microscope for normal-incidence nanofocus X-ray experiments
@en
P2093
A Panzarella
M Burghammer
M Rosenthal
O Hignette
P2860
P304
P356
10.1107/S1600577516011437
P577
2016-08-10T00:00:00Z