Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces.
about
Development of low temperature atomic force microscopy with an optical beam deflection system capable of simultaneously detecting the lateral and vertical forces.
description
2016 nî lūn-bûn
@nan
2016年の論文
@ja
2016年論文
@yue
2016年論文
@zh-hant
2016年論文
@zh-hk
2016年論文
@zh-mo
2016年論文
@zh-tw
2016年论文
@wuu
2016年论文
@zh
2016年论文
@zh-cn
name
Development of low temperature ...... e lateral and vertical forces.
@ast
Development of low temperature ...... e lateral and vertical forces.
@en
type
label
Development of low temperature ...... e lateral and vertical forces.
@ast
Development of low temperature ...... e lateral and vertical forces.
@en
prefLabel
Development of low temperature ...... e lateral and vertical forces.
@ast
Development of low temperature ...... e lateral and vertical forces.
@en
P2093
P2860
P356
P1476
Development of low temperature ...... e lateral and vertical forces.
@en
P2093
Eiji Arima
Huanfei Wen
Yan Jun Li
Yasuhiro Sugawara
Yoshitaka Naitoh
P2860
P304
P356
10.1063/1.4962865
P407
P577
2016-09-01T00:00:00Z