A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

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A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

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2017 nî lūn-bûn

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2017年の論文

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2017年学术文章

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2017年学术文章

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2017年学术文章

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2017年学术文章

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A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

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A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

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Item

label

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

@ast

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

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A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

@ast

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

@en

P1476

A Novel Method for In Situ Electromechanical Characterization of Nanoscale Specimens

@en

P2093

Alberto Piqué

http://www.w3.org/2001/XMLSchema#string

Russell C Reid

http://www.w3.org/2001/XMLSchema#string

Wonmo Kang

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P2860

An electromechanical material testing system for in situ electron microscopy and applications.

Deformation mechanisms in free-standing nanoscale thin films: a quantitative in situ transmission electron microscope study.

Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films.

In situ thermomechanical testing methods for micro/nano-scale materials.

P31

scholarly article

P356

10.3791/55735

http://www.w3.org/2001/XMLSchema#string

P433

124

http://www.w3.org/2001/XMLSchema#string

P577

2017-06-02T00:00:00Z

http://www.w3.org/2001/XMLSchema#dateTime

P698

28605394

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P932

5608240

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