Predictive validity of the Level of Expressed Emotion (LEE) Scale: readmission follow-up data for 1, 2, and 5-year periods.
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Predictive validity of the Level of Expressed Emotion (LEE) Scale: readmission follow-up data for 1, 2, and 5-year periods.
description
1993 nî lūn-bûn
@nan
1993年の論文
@ja
1993年論文
@yue
1993年論文
@zh-hant
1993年論文
@zh-hk
1993年論文
@zh-mo
1993年論文
@zh-tw
1993年论文
@wuu
1993年论文
@zh
1993年论文
@zh-cn
name
Predictive validity of the Lev ...... for 1, 2, and 5-year periods.
@ast
Predictive validity of the Lev ...... for 1, 2, and 5-year periods.
@en
type
label
Predictive validity of the Lev ...... for 1, 2, and 5-year periods.
@ast
Predictive validity of the Lev ...... for 1, 2, and 5-year periods.
@en
prefLabel
Predictive validity of the Lev ...... for 1, 2, and 5-year periods.
@ast
Predictive validity of the Lev ...... for 1, 2, and 5-year periods.
@en
P1476
Predictive validity of the Lev ...... for 1, 2, and 5-year periods.
@en
P2093
P304
P356
10.1002/1097-4679(199303)49:2<216::AID-JCLP2270490214>3.0.CO;2-G
P577
1993-03-01T00:00:00Z