Nanoscale characterization of local structures and defects in photonic crystals using synchrotron-based transmission soft X-ray microscopy.
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Nanoscale characterization of local structures and defects in photonic crystals using synchrotron-based transmission soft X-ray microscopy.
description
2016 nî lūn-bûn
@nan
2016年の論文
@ja
2016年論文
@yue
2016年論文
@zh-hant
2016年論文
@zh-hk
2016年論文
@zh-mo
2016年論文
@zh-tw
2016年论文
@wuu
2016年论文
@zh
2016年论文
@zh-cn
name
Nanoscale characterization of ...... mission soft X-ray microscopy.
@ast
Nanoscale characterization of ...... mission soft X-ray microscopy.
@en
type
label
Nanoscale characterization of ...... mission soft X-ray microscopy.
@ast
Nanoscale characterization of ...... mission soft X-ray microscopy.
@en
prefLabel
Nanoscale characterization of ...... mission soft X-ray microscopy.
@ast
Nanoscale characterization of ...... mission soft X-ray microscopy.
@en
P2093
P2860
P356
P1433
P1476
Nanoscale characterization of ...... mission soft X-ray microscopy.
@en
P2093
Hyun Woo Nho
Hyun-Joon Shin
Tae Hyun Yoon
Yogesh Kalegowda
P2860
P2888
P356
10.1038/SREP24488
P407
P577
2016-04-18T00:00:00Z