Invited review article: a review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements.
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A simple method for producing flattened atomic force microscopy tips.Colloid probes with increased tip height for higher sensitivity in friction force microscopy and less cantilever damping in dynamic force microscopy.A direct micropipette-based calibration method for atomic force microscope cantilevers.Note: tip enhanced Raman spectroscopy with objective scanner on opaque samples.Note: Mechanical etching of atomic force microscope tip and microsphere attachment for thermal radiation scattering enhancement.Nanomanipulation and controlled self-assembly of metal nanoparticles and nanocrystals for plasmonics.Tracking Optical and Electronic Behaviour of Quantum Contacts in Sub-Nanometre Plasmonic CavitiesGap controlled plasmon-dielectric coupling effects investigated with single nanoparticle-terminated atomic force microscope probes.Characterization of single 1.8-nm Au nanoparticle attachments on AFM tips for single sub-4-nm object pickup.Biomechanical regulation of cell orientation and fateNanopipette exploring nanoworld.Developments in and practical guidelines for tip-enhanced Raman spectroscopy.Invited review article: combining scanning probe microscopy with optical spectroscopy for applications in biology and materials science.Extending the limits of direct force measurements: colloidal probes from sub-micron particles.Nanomechanical and topographical imaging of living cells by atomic force microscopy with colloidal probes.Invited Review Article: Tip modification methods for tip-enhanced Raman spectroscopy (TERS) and colloidal probe technique: A 10 year update (2006-2016) review.Facile Fabrication of Spherical Nanoparticle-Tipped AFM Probes for Plasmonic Applications.Note: Production of stable colloidal probes for high-temperature atomic force microscopy applications.Metal-filled carbon nanotube based optical nanoantennas: bubbling, reshaping, and in situ characterization.A silver nanowire-based tip suitable for STM tip-enhanced Raman scatteringTime-Resolved 2PPE and Time-Resolved PEEM as a Probe of LSP's in Silver NanoparticlesTwo-Photon Photoemission of Plasmonic Nanostructures with High Temporal and Lateral Resolution
P2860
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P2860
Invited review article: a review of techniques for attaching micro- and nanoparticles to a probe's tip for surface force and near-field optical measurements.
description
2007 nî lūn-bûn
@nan
2007年の論文
@ja
2007年論文
@yue
2007年論文
@zh-hant
2007年論文
@zh-hk
2007年論文
@zh-mo
2007年論文
@zh-tw
2007年论文
@wuu
2007年论文
@zh
2007年论文
@zh-cn
name
Invited review article: a revi ...... ar-field optical measurements.
@en
type
label
Invited review article: a revi ...... ar-field optical measurements.
@en
prefLabel
Invited review article: a revi ...... ar-field optical measurements.
@en
P2860
P356
P1476
Invited review article: a revi ...... ar-field optical measurements.
@en
P2093
P2860
P304
P356
10.1063/1.2754076
P407
P577
2007-08-01T00:00:00Z