Origins of nanoscale damage to glass-sealed platinum electrodes with submicrometer and nanometer size.
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Focused-Ion-Beam-Milled Carbon Nanoelectrodes for Scanning Electrochemical MicroscopyAdvanced electroanalytical chemistry at nanoelectrodes.Double Potential Pulse Chronocoulometry for Detection of Plasma Membrane Cholesterol Efflux at Disk Platinum Microelectrodes.Ion permeability of the nuclear pore complex and ion-induced macromolecular permeation as studied by scanning electrochemical and fluorescence microscopy.Electrochemistry of nanoparticles.Electrochemistry at highly oriented pyrolytic graphite (HOPG): lower limit for the kinetics of outer-sphere redox processes and general implications for electron transfer models.Characterization of Nanopipet-Supported ITIES Tips for Scanning Electrochemical Microscopy of Single Solid-State Nanopores.Scanning electrochemical microscopy: an analytical perspective.Multifunctional scanning ion conductance microscopy.
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P2860
Origins of nanoscale damage to glass-sealed platinum electrodes with submicrometer and nanometer size.
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article científic
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article scientifique
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articolo scientifico
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artigo científico
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bilimsel makale
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scientific article published on 13 June 2013
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vedecký článok
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vetenskaplig artikel
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videnskabelig artikel
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vědecký článek
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name
Origins of nanoscale damage to ...... micrometer and nanometer size.
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Origins of nanoscale damage to ...... micrometer and nanometer size.
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type
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Origins of nanoscale damage to ...... micrometer and nanometer size.
@en
Origins of nanoscale damage to ...... micrometer and nanometer size.
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prefLabel
Origins of nanoscale damage to ...... micrometer and nanometer size.
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Origins of nanoscale damage to ...... micrometer and nanometer size.
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P2093
P2860
P356
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Origins of nanoscale damage to ...... bmicrometer and nanometer size
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P2093
Jiyeon Kim
Nikoloz Nioradze
Padmanabhan Santhosh
Shigeru Amemiya
P2860
P304
P356
10.1021/AC401316N
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P50
P577
2013-06-13T00:00:00Z