The European nanometrology landscape.

The European nanometrology landscape.

Item
http://www.wikidata.org/entity/Q37826607
Development of Data Registration and Fusion Methods for Measurement of Ultra-Precision Freeform Surfaces.Feasibility study on 3-D shape analysis of high-aspect-ratio features using through-focus scanning optical microscopyShort-range six-axis interferometer controlled positioning for scanning probe microscopy.Optimizing noise for defect analysis with through-focus scanning optical microscopy.A novel approach for measuring the intrinsic nanoscale thickness of polymer brushes by means of atomic force microscopy: application of a compressible fluid model.Polyaniline-nanodiamond fibers resulting from the self-assembly of nano-fibrils: a nanomechanical study.Direct structural characterisation of line gratings with grazing incidence small-angle x-ray scattering.Kelvin force microscopy characterization of charging effect in thin a-SiOxNy:H layers deposited in pulsed plasma enhanced chemical vapor deposition process by tuning the Silicon-environment
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The European nanometrology landscape.

Item
http://www.wikidata.org/entity/Q37826607
description
article científic
@ca
article scientifique
@fr
articolo scientifico
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artigo científico
@pt
bilimsel makale
@tr
scientific article published on 07 January 2011
@en
vedecký článok
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vetenskaplig artikel
@sv
videnskabelig artikel
@da
vědecký článek
@cs
name
The European nanometrology landscape.
@en
The European nanometrology landscape.
@nl
type
label
The European nanometrology landscape.
@en
The European nanometrology landscape.
@nl
prefLabel
The European nanometrology landscape.
@en
The European nanometrology landscape.
@nl
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The European nanometrology landscape
@en
P2093
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10.1088/0957-4484/22/6/062001
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P5875
P698