Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces.
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Visualizing the orientational dependence of an intermolecular potentialNano-contact microscopy of supracrystals.Measuring the reactivity of a silicon-terminated probeIntramolecular bonds resolved on a semiconductor surfaceDiscriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopyIdentifying the absolute orientation of a low-symmetry surface in real space
P2860
Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces.
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2014 nî lūn-bûn
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name
Uncertainties in forces extrac ...... long-range background forces.
@en
type
label
Uncertainties in forces extrac ...... long-range background forces.
@en
prefLabel
Uncertainties in forces extrac ...... long-range background forces.
@en
P2860
P356
P1476
Uncertainties in forces extrac ...... long-range background forces.
@en
P2093
Adam Sweetman
Andrew Stannard
P2860
P304
P356
10.3762/BJNANO.5.45
P577
2014-04-01T00:00:00Z