The sinusoidal probe: a new approach to improve electrode longevity.
about
Mechanical and Biological Interactions of Implants with the Brain and Their Impact on Implant DesignNeuroelectronics and Biooptics: Closed-Loop Technologies in Neurological DisordersA novel wireless recording and stimulating multichannel epicortical grid for supplementing or enhancing the sensory-motor functions in monkey (Macaca fascicularis).An array of highly flexible electrodes with a tailored configuration locked by gelatin during implantation-initial evaluation in cortex cerebri of awake rats.Ultraflexible nanoelectronic probes form reliable, glial scar-free neural integration.Characterization of Mechanically Matched Hydrogel Coatings to Improve the Biocompatibility of Neural Implants.In vivo monitoring of glial scar proliferation on chronically implanted neural electrodes by fiber optical coherence tomography.Mechanical Flexibility Reduces the Foreign Body Response to Long-Term Implanted Microelectrodes in Rabbit Cortex.Brain-Machine Interfaces: From Basic Science to Neuroprostheses and Neurorehabilitation.The chronic challenge-new vistas on long-term multisite contacts to the central nervous system.Acute in vivo testing of a conformal polymer microelectrode array for multi-region hippocampal recordings.A three dimensional in vitro glial scar model to investigate the local strain effects from micromotion around neural implants.Neural Interfaces for Intracortical Recording: Requirements, Fabrication Methods, and Characteristics.A Mosquito Inspired Strategy to Implant Microprobes into the Brain.Three-dimensional macroporous nanoelectronic networks as minimally invasive brain probes.Characterization of the Neuroinflammatory Response to Thiol-ene Shape Memory Polymer Coated Intracortical MicroelectrodesDesign Choices for Next-Generation Neurotechnology Can Impact Motion Artifact in Electrophysiological and Fast-Scan Cyclic Voltammetry Measurements
P2860
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P2860
The sinusoidal probe: a new approach to improve electrode longevity.
description
2014 nî lūn-bûn
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2014年の論文
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2014年学术文章
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2014年学术文章
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2014年学术文章
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name
The sinusoidal probe: a new approach to improve electrode longevity.
@en
The sinusoidal probe: a new approach to improve electrode longevity.
@nl
type
label
The sinusoidal probe: a new approach to improve electrode longevity.
@en
The sinusoidal probe: a new approach to improve electrode longevity.
@nl
prefLabel
The sinusoidal probe: a new approach to improve electrode longevity.
@en
The sinusoidal probe: a new approach to improve electrode longevity.
@nl
P2093
P2860
P50
P356
P1476
The sinusoidal probe: a new approach to improve electrode longevity
@en
P2093
Andrew Jackson
Harbaljit S Sohal
Konstantin Vassilevski
Richard Jackson
P2860
P356
10.3389/FNENG.2014.00010
P577
2014-04-29T00:00:00Z