Digital wavefront measuring interferometer for testing optical surfaces and lenses.
about
A universal moiré effect and application in X-ray phase-contrast imagingMotionless phase stepping in X-ray phase contrast imaging with a compact sourceQuantitative refractive index distribution of single cell by combining phase-shifting interferometry and AFM imagingPhase-shifting interferometer using a frequency-tunable diode laser calibrated by an optical frequency comb.Enhancing Tabletop X-Ray Phase Contrast Imaging with Nano-FabricationFlexible retrospective phase stepping in x-ray scatter correction and phase contrast imaging using structured illumination.Interferometric methods for label-free molecular interaction studiesAn improved phase shift reconstruction algorithm of fringe scanning technique for X-ray microscopy.Visual measurement of the evaporation process of a sessile droplet by dual-channel simultaneous phase-shifting interferometryEfficient decoding of 2D structured illumination with linear phase stepping in X-ray phase contrast and dark-field imaging.An advanced phase retrieval algorithm in N-step phase-shifting interferometry with unknown phase shiftsInvited review article: measurement uncertainty of linear phase-stepping algorithms.X-ray analyzer-based phase-contrast computed laminography.Nanoparticle detection using dual-phase interferometry.Trends and challenges in experimental macromolecular crystallography.Numerical fringe pattern demodulation strategies in interferometry.Wavefield characterization of nearly diffraction-limited focused hard x-ray beam with size less than 10 nm.Magnetic-flux quanta in superconducting thin films observed by electron holography and digital phase analysis.Hard-X-ray phase-difference microscopy using a fresnel zone plate and a transmission grating.Digital holography and its multidimensional imaging applications: a review.
P2860
Q29040112-DDEF8EC0-C843-4A58-85BB-409CC7E58025Q30558239-5069DF18-BFD4-489A-A487-CF4022045A28Q33747287-EE20EE4E-CCA4-4B20-B010-06A335857145Q34361175-193E4CE6-655E-4B3F-9279-B95BF8BC900DQ34491364-BA3CFF31-179F-41DA-9574-C0CF31301FB3Q35036267-E151F4BB-E3DC-4F2A-BC3D-D9DD5F4C6F1CQ35050015-217F7838-D9AE-46F5-ADB3-144DB932B34AQ35569423-B32B369A-F6A7-4458-85C2-665BD309A70FQ35856502-0312D11E-74E8-4CFB-88F2-ABC0AF6AD0A6Q37525563-D24181C1-BF92-45E2-A3C9-C70A82E1B1CBQ37698711-B7184136-B3AC-439F-9338-0880BF7125B7Q37896603-A92858BE-D9FB-405F-952B-7AAB212A0E01Q39244487-C27FED6B-DFE2-47ED-AAB9-CD656A02E4CDQ40709154-EDD7B161-7830-442D-8656-A369B28D9875Q41270302-61C3CE1E-4512-41C5-B800-A1AAE4AA0CF8Q44449590-57B3C9D6-9098-4E39-B9CA-B5588EC656C7Q47398080-325BDC93-6940-4C2B-ABAB-745D25E0E8D5Q48597024-97DA8978-09AF-4A91-886B-25B34628A447Q51776002-9AAD12BA-D68C-4153-9897-A1DB958CEBEDQ55486731-23AEBF4D-3D11-444F-8B35-FBC088A49A73
P2860
Digital wavefront measuring interferometer for testing optical surfaces and lenses.
description
1974 nî lūn-bûn
@nan
1974年の論文
@ja
1974年学术文章
@wuu
1974年学术文章
@zh-cn
1974年学术文章
@zh-hans
1974年学术文章
@zh-my
1974年学术文章
@zh-sg
1974年學術文章
@yue
1974年學術文章
@zh
1974年學術文章
@zh-hant
name
Digital wavefront measuring interferometer for testing optical surfaces and lenses.
@en
Digital wavefront measuring interferometer for testing optical surfaces and lenses.
@nl
type
label
Digital wavefront measuring interferometer for testing optical surfaces and lenses.
@en
Digital wavefront measuring interferometer for testing optical surfaces and lenses.
@nl
prefLabel
Digital wavefront measuring interferometer for testing optical surfaces and lenses.
@en
Digital wavefront measuring interferometer for testing optical surfaces and lenses.
@nl
P2093
P356
P1433
P1476
Digital wavefront measuring interferometer for testing optical surfaces and lenses.
@en
P2093
D J Brangaccio
D P Rosenfeld
D R Herriott
J E Gallagher
J H Bruning
P304
P356
10.1364/AO.13.002693
P407
P577
1974-11-01T00:00:00Z