Nanoscale simultaneous chemical and mechanical imaging via peak force infrared microscopy.
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Spectroscopic Imaging at the Nanoscale: Technologies and Recent Applications.Nanoscale spectroscopic and mechanical characterization of individual aerosol particles using peak force infrared microscopy.Tomographic and multimodal scattering-type scanning near-field optical microscopy with peak force tapping mode.Substructure imaging of heterogeneous nanomaterials with enhanced refractive index contrast by using a functionalized tip in photoinduced force microscopyRecent advances in hybrid measurement methods based on atomic force microscopy and surface sensitive measurement techniquesDrumming up single-molecule beats
P2860
Nanoscale simultaneous chemical and mechanical imaging via peak force infrared microscopy.
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2017 nî lūn-bûn
@nan
2017年の論文
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2017年学术文章
@wuu
2017年学术文章
@zh-cn
2017年学术文章
@zh-hans
2017年学术文章
@zh-my
2017年学术文章
@zh-sg
2017年學術文章
@yue
2017年學術文章
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2017年學術文章
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name
Nanoscale simultaneous chemica ...... eak force infrared microscopy.
@en
type
label
Nanoscale simultaneous chemica ...... eak force infrared microscopy.
@en
prefLabel
Nanoscale simultaneous chemica ...... eak force infrared microscopy.
@en
P2093
P2860
P356
P1433
P1476
Nanoscale simultaneous chemica ...... eak force infrared microscopy.
@en
P2093
Devon S Jakob
Haomin Wang
Martin Wagner
P2860
P304
P356
10.1126/SCIADV.1700255
P577
2017-06-23T00:00:00Z