A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging
about
A new ion sensing deep atomic force microscope.Scanning ion conductance microscopy for studying biological samples.Imaging the cell surface and its organization down to the level of single molecules.Migrating oligodendrocyte progenitor cells swell prior to soma dislocation.Double micropipettes configuration method of scanning ion conductance microscopy.
P2860
A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging
description
2012 nî lūn-bûn
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2012年の論文
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name
A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging
@en
type
label
A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging
@en
prefLabel
A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging
@en
P2093
P2860
P1433
P1476
A hybrid scanning mode for fast scanning ion conductance microscopy (SICM) imaging
@en
P2093
Alex Zhukov
Owen Richards
Victor Ostanin
P2860
P356
10.1016/J.ULTRAMIC.2012.06.015
P577
2012-07-05T00:00:00Z