Single-photon imaging in complementary metal oxide semiconductor processes.
about
Photon Counting Imaging with an Electron-Bombarded Pixel Image SensorA high speed multifocal multiphoton fluorescence lifetime imaging microscope for live-cell FRET imagingPhoton counting phosphorescence lifetime imaging with TimepixCam.Noise Reduction Techniques and Scaling Effects towards Photon Counting CMOS Image Sensors.Time-resolved single-photon detection module based on silicon photomultiplier: A novel building block for time-correlated measurement systems.
P2860
Single-photon imaging in complementary metal oxide semiconductor processes.
description
2014 nî lūn-bûn
@nan
2014年の論文
@ja
2014年論文
@yue
2014年論文
@zh-hant
2014年論文
@zh-hk
2014年論文
@zh-mo
2014年論文
@zh-tw
2014年论文
@wuu
2014年论文
@zh
2014年论文
@zh-cn
name
Single-photon imaging in complementary metal oxide semiconductor processes.
@en
type
label
Single-photon imaging in complementary metal oxide semiconductor processes.
@en
prefLabel
Single-photon imaging in complementary metal oxide semiconductor processes.
@en
P2860
P356
P1476
Single-photon imaging in complementary metal oxide semiconductor processes.
@en
P2093
P2860
P304
P356
10.1098/RSTA.2013.0100
P407
P577
2014-02-24T00:00:00Z