Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer.
about
Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer.
description
2014 nî lūn-bûn
@nan
2014年の論文
@ja
2014年論文
@yue
2014年論文
@zh-hant
2014年論文
@zh-hk
2014年論文
@zh-mo
2014年論文
@zh-tw
2014年论文
@wuu
2014年论文
@zh
2014年论文
@zh-cn
name
Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer.
@en
Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer.
@nl
type
label
Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer.
@en
Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer.
@nl
prefLabel
Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer.
@en
Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer.
@nl
P2860
P356
P1476
Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer.
@en
P2093
Andrew Wang
P2860
P304
P356
10.1063/1.4892075
P407
P577
2014-08-01T00:00:00Z