Origin of the dielectric dead layer in nanoscale capacitors.
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A SHORT REVIEW ON DEEP-SUB-VOLTAGE NANOELECTRONICS AND RELATED TECHNOLOGIESTunable conductivity threshold at polar oxide interfaces.A new method for achieving enhanced dielectric response over a wide temperature range.Built-in Electric Field Induced Mechanical Property Change at the Lanthanum Nickelate/Nb-doped Strontium Titanate Interfaces.Frustration of Negative Capacitance in Al2O3/BaTiO3 Bilayer Structure.Strain evolution of each type of grains in poly-crystalline (Ba,Sr)TiO(3) thin films grown by sputtering.Multiferroics: progress and prospects in thin films.Room-temperature ferroelectricity in CuInP2S6 ultrathin flakesSurface reconstructions and related local properties of a BiFeO3 thin filmStructure and properties of functional oxide thin films: insights from electronic-structure calculations.Two-dimensional dielectric nanosheets: novel nanoelectronics from nanocrystal building blocks.Dielectric collapse at the LaAlO3/SrTiO3 (001) heterointerface under applied electric field.Resistive switching and its suppression in Pt/Nb:SrTiO3 junctions.Ultrathin Ferroelectric Films: Growth, Characterization, Physics and Applications.Electric polarization switching in an atomically thin binary rock salt structure.PbTiO3-based perovskite ferroelectric and multiferroic thin films.Competition between Polar and Nonpolar Lattice Distortions in Oxide Quantum Wells: New Critical Thickness at Polar Interfaces.Phase-field model of oxidation: Equilibrium.Microscopic response to inhomogeneous deformations in curvilinear coordinates.Settling the "dead layer" debate in nanoscale capacitors.Understanding ferroelectricity in layered perovskites: new ideas and insights from theory and experiments.Mechanical strain can switch the sign of quantum capacitance from positive to negative.Shedding Light on Oxide InterfacesFirst-principles modeling of ferroelectric capacitors via constrained displacement field calculationsMagnetic ordering and structural phase transitions in a strained ultrathin SrRuO3/SrTiO3 superlatticeDirect Demonstration of a Magnetic Dead Layer Resulting from A-Site Cation Inhomogeneity in a (La,Sr)MnO3Epitaxial Film SystemThickness-dependent domain wall reorientation in 70/30 lead magnesium niobate- lead titanate thin filmsScaling Effects in Perovskite Ferroelectrics: Fundamental Limits and Process-Structure-Property RelationsRole of composition and structure on the properties of metal/multifunctional ceramic interfacesAtomic-Scale Compensation Phenomena at Polar InterfacesNonlinear Piezoelectricity in Epitaxial Ferroelectrics at High Electric FieldsLarge in-plane permittivity of Ba0.6Sr0.4TiO3 thin films crystallized using excimer laser annealing at 300 °CStructure determination of monolayer-by-monolayer grownLa1−xSrxMnO3thin films and the onset of magnetoresistanceDiodes with breakdown voltages enhanced by the metal-insulator transition of LaAlO3–SrTiO3 interfacesThickness-Dependent Electrocaloric Effect in Pb0.9La0.1Zr0.65Ti0.35O3 Films Grown by Sol–Gel ProcessTitanium dioxide thin films for next-generation memory devices
P2860
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P2860
Origin of the dielectric dead layer in nanoscale capacitors.
description
2006 nî lūn-bûn
@nan
2006年の論文
@ja
2006年学术文章
@wuu
2006年学术文章
@zh-cn
2006年学术文章
@zh-hans
2006年学术文章
@zh-my
2006年学术文章
@zh-sg
2006年學術文章
@yue
2006年學術文章
@zh
2006年學術文章
@zh-hant
name
Origin of the dielectric dead layer in nanoscale capacitors.
@en
Origin of the dielectric dead layer in nanoscale capacitors.
@nl
type
label
Origin of the dielectric dead layer in nanoscale capacitors.
@en
Origin of the dielectric dead layer in nanoscale capacitors.
@nl
prefLabel
Origin of the dielectric dead layer in nanoscale capacitors.
@en
Origin of the dielectric dead layer in nanoscale capacitors.
@nl
P2860
P356
P1433
P1476
Origin of the dielectric dead layer in nanoscale capacitors.
@en
P2860
P2888
P304
P356
10.1038/NATURE05148
P407
P577
2006-10-01T00:00:00Z
P6179
1046710132