One nanometer resolution electrical probe via atomic metal filament formation.
about
Interfacial chemical bonding-mediated ionic resistive switching.Tunnel conductivity switching in a single nanoparticle-based nano floating gate memory.Growth of single gold nanofilaments at the apex of conductive atomic force microscope tips.Invited Review Article: Tip modification methods for tip-enhanced Raman spectroscopy (TERS) and colloidal probe technique: A 10 year update (2006-2016) review.Emerging fabrication techniques for 3D nano-structuring in plasmonics and single molecule studies.Conductive AFM for CNT characterization.
P2860
One nanometer resolution electrical probe via atomic metal filament formation.
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2010 nî lūn-bûn
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2010年の論文
@ja
2010年学术文章
@wuu
2010年学术文章
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2010年学术文章
@zh-cn
2010年学术文章
@zh-hans
2010年学术文章
@zh-my
2010年学术文章
@zh-sg
2010年學術文章
@yue
2010年學術文章
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name
One nanometer resolution electrical probe via atomic metal filament formation.
@en
One nanometer resolution electrical probe via atomic metal filament formation.
@nl
type
label
One nanometer resolution electrical probe via atomic metal filament formation.
@en
One nanometer resolution electrical probe via atomic metal filament formation.
@nl
prefLabel
One nanometer resolution electrical probe via atomic metal filament formation.
@en
One nanometer resolution electrical probe via atomic metal filament formation.
@nl
P2093
P356
P1433
P1476
One nanometer resolution electrical probe via atomic metal filament formation.
@en
P2093
Judy J Cha
Seung Sae Hong
P304
P356
10.1021/NL103603V
P407
P577
2010-12-01T00:00:00Z