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Relationships between chemical structure, mechanical properties and materials processing in nanopatterned organosilicate finsNanoscale Buckling of Ultrathin Low-k Dielectric Lines during Hard-Mask Patterning.Full Characterization of the Mechanical Properties of 11-50 nm Ultrathin Films: Influence of Network Connectivity on the Poisson's Ratio.Nanoscale mapping of contact stiffness and damping by contact resonance atomic force microscopy.Nanoscale tomographic reconstruction of the subsurface mechanical properties of low-k high-aspect ratio patterns.Toughening thin-film structures with ceramic-like amorphous silicon carbide films.Spectroscopic method for measuring refractive index
P50
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P50
description
hulumtues
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researcher
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հետազոտող
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name
Sean W. King
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Sean W. King
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Sean W. King
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Sean W. King
@nl
Sean W. King
@sl
شون دبليو كينغ
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type
label
Sean W. King
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Sean W. King
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Sean W. King
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Sean W. King
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Sean W. King
@sl
شون دبليو كينغ
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prefLabel
Sean W. King
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Sean W. King
@en
Sean W. King
@es
Sean W. King
@nl
Sean W. King
@sl
شون دبليو كينغ
@ar
P1053
A-5445-2012
P106
P108
P1153
7403002177
P21
P31
P3829
P496
0000-0001-5400-7679