An investigation of secondary ion yield enhancement using Bin2+ (n=1,3,5) primary ions.
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Improving the Molecular Ion Signal Intensity for In Situ Liquid SIMS Analysis.Investigation of polymer thin films by use of Bi-cluster-ion-supported time of flight secondary ion mass spectrometry.An investigation of the beam damage effect on in situ liquid secondary ion mass spectrometry analysis.Yields and images of secondary ions from organic materials by different primary Bi ions in time-of-flight secondary ion mass spectrometry.
P2860
An investigation of secondary ion yield enhancement using Bin2+ (n=1,3,5) primary ions.
description
2008 nî lūn-bûn
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2008年の論文
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2008年学术文章
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2008年学术文章
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2008年学术文章
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2008年学术文章
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2008年学术文章
@zh-sg
2008年學術文章
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2008年學術文章
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2008年學術文章
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name
An investigation of secondary ion yield enhancement using Bin2+ (n=1,3,5) primary ions.
@en
An investigation of secondary ion yield enhancement using Bin2+ (n=1,3,5) primary ions.
@nl
type
label
An investigation of secondary ion yield enhancement using Bin2+ (n=1,3,5) primary ions.
@en
An investigation of secondary ion yield enhancement using Bin2+ (n=1,3,5) primary ions.
@nl
prefLabel
An investigation of secondary ion yield enhancement using Bin2+ (n=1,3,5) primary ions.
@en
An investigation of secondary ion yield enhancement using Bin2+ (n=1,3,5) primary ions.
@nl
P2093
P2860
P1476
An investigation of secondary ion yield enhancement using Bin2+ (n=1,3,5) primary ions.
@en
P2093
Amy V Walker
Gabriella Nagy
P2860
P2888
P356
10.1016/J.JASMS.2007.10.016
P577
2008-01-01T00:00:00Z
P5875
P6179
1049331705