High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and radius for electrostatic force microscopy.
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High-aspect ratio metal tips attached to atomic force microscopy cantilevers with controlled angle, length, and radius for electrostatic force microscopy.
description
2007 nî lūn-bûn
@nan
2007年の論文
@ja
2007年学术文章
@wuu
2007年学术文章
@zh
2007年学术文章
@zh-cn
2007年学术文章
@zh-hans
2007年学术文章
@zh-my
2007年学术文章
@zh-sg
2007年學術文章
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2007年學術文章
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name
High-aspect ratio metal tips a ...... lectrostatic force microscopy.
@en
High-aspect ratio metal tips a ...... lectrostatic force microscopy.
@nl
type
label
High-aspect ratio metal tips a ...... lectrostatic force microscopy.
@en
High-aspect ratio metal tips a ...... lectrostatic force microscopy.
@nl
prefLabel
High-aspect ratio metal tips a ...... lectrostatic force microscopy.
@en
High-aspect ratio metal tips a ...... lectrostatic force microscopy.
@nl
P2093
P356
P1476
High-aspect ratio metal tips a ...... lectrostatic force microscopy.
@en
P2093
Lynda Cockins
Peter Grutter
Romain Stomp
Yoichi Miyahara
P2860
P304
P356
10.1063/1.2805513
P577
2007-11-01T00:00:00Z