Development of eddy current microscopy for high resolution electrical conductivity imaging using atomic force microscopy.
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Electromagnetic imaging methods for nondestructive evaluation applications.Probing of multiple magnetic responses in magnetic inductors using atomic force microscopy.Invited review article: combining scanning probe microscopy with optical spectroscopy for applications in biology and materials science.Mapping the process dependent conductivity of carbon nanotube thin-films using a non-invasive contact probing system.
P2860
Development of eddy current microscopy for high resolution electrical conductivity imaging using atomic force microscopy.
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2008 nî lūn-bûn
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2008年の論文
@ja
2008年学术文章
@wuu
2008年学术文章
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2008年学术文章
@zh-cn
2008年学术文章
@zh-hans
2008年学术文章
@zh-my
2008年学术文章
@zh-sg
2008年學術文章
@yue
2008年學術文章
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name
Development of eddy current mi ...... using atomic force microscopy.
@en
Development of eddy current mi ...... using atomic force microscopy.
@nl
type
label
Development of eddy current mi ...... using atomic force microscopy.
@en
Development of eddy current mi ...... using atomic force microscopy.
@nl
prefLabel
Development of eddy current mi ...... using atomic force microscopy.
@en
Development of eddy current mi ...... using atomic force microscopy.
@nl
P2093
P2860
P356
P1476
Development of eddy current mi ...... using atomic force microscopy.
@en
P2093
M P Blodgett
V Nalladega
P2860
P304
P356
10.1063/1.2955470
P577
2008-07-01T00:00:00Z