Investigation of the in-plane and out-of-plane electrical properties of metallic nanoparticles in dielectric matrix thin films elaborated by atomic layer deposition.
about
Investigation of the in-plane and out-of-plane electrical properties of metallic nanoparticles in dielectric matrix thin films elaborated by atomic layer deposition.
description
2017 nî lūn-bûn
@nan
2017年の論文
@ja
2017年学术文章
@wuu
2017年学术文章
@zh
2017年学术文章
@zh-cn
2017年学术文章
@zh-hans
2017年学术文章
@zh-my
2017年学术文章
@zh-sg
2017年學術文章
@yue
2017年學術文章
@zh-hant
name
Investigation of the in-plane ...... ed by atomic layer deposition.
@en
Investigation of the in-plane ...... ed by atomic layer deposition.
@nl
type
label
Investigation of the in-plane ...... ed by atomic layer deposition.
@en
Investigation of the in-plane ...... ed by atomic layer deposition.
@nl
prefLabel
Investigation of the in-plane ...... ed by atomic layer deposition.
@en
Investigation of the in-plane ...... ed by atomic layer deposition.
@nl
P2093
P50
P356
P1433
P1476
Investigation of the in-plane ...... ed by atomic layer deposition.
@en
P2093
A Malchère
D Albertini
L Militaru
M Le Berre
P304
P356
10.1088/1361-6528/AA8B5E
P577
2017-10-17T00:00:00Z