Microscopic charge fluctuations cause minimal contrast loss in cryoEM.

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Ewald sphere correction using a single side-band image processing algorithm.Charge accumulation in electron cryomicroscopy.

P2860

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Microscopic charge fluctuations cause minimal contrast loss in cryoEM.

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http://www.wikidata.org/entity/Q50138609

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2018 nî lūn-bûn

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2018年の論文

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2018年学术文章

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Microscopic charge fluctuations cause minimal contrast loss in cryoEM.

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Microscopic charge fluctuations cause minimal contrast loss in cryoEM.

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label

Microscopic charge fluctuations cause minimal contrast loss in cryoEM.

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Microscopic charge fluctuations cause minimal contrast loss in cryoEM.

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Microscopic charge fluctuations cause minimal contrast loss in cryoEM.

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Microscopic charge fluctuations cause minimal contrast loss in cryoEM.

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P1476

Microscopic charge fluctuations cause minimal contrast loss in cryoEM.

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P2093

Christopher J Russo

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P2860

Restoration of weak phase-contrast images recorded with a high degree of defocus: the "twin image" problem associated with CTF correction

Cryo-electron microscopy of vitrified specimens

Electron microscopy: Ultrastable gold substrates for electron cryomicroscopy.

Thon rings from amorphous ice and implications of beam-induced Brownian motion in single particle electron cryo-microscopy.

Electric charging of thin films measured using the contrast transfer function.

Volta potential phase plate for in-focus phase contrast transmission electron microscopy.

Measuring the optimal exposure for single particle cryo-EM using a 2.6 Å reconstruction of rotavirus VP6

Beam-induced motion of vitrified specimen on holey carbon film.

Single particle electron cryomicroscopy: trends, issues and future perspective.

Using the Volta phase plate with defocus for cryo-EM single particle analysis.

P304

56-63

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scholarly article

P356

10.1016/J.ULTRAMIC.2018.01.011

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187

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Richard Henderson

Christopher J Russo

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2018-01-31T00:00:00Z

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29413413

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P932

5862660

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Microscopic charge fluctuations cause minimal contrast loss in cryoEM.

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P2860

P2860

Microscopic charge fluctuations cause minimal contrast loss in cryoEM.

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