In situ synchrotron X-ray diffraction analysis of deformation behaviour in Ti-Ni-based thin films.
about
In situ synchrotron X-ray diffraction analysis of deformation behaviour in Ti-Ni-based thin films.
description
2015 nî lūn-bûn
@nan
2015年の論文
@ja
2015年学术文章
@wuu
2015年学术文章
@zh
2015年学术文章
@zh-cn
2015年学术文章
@zh-hans
2015年学术文章
@zh-my
2015年学术文章
@zh-sg
2015年學術文章
@yue
2015年學術文章
@zh-hant
name
In situ synchrotron X-ray diff ...... our in Ti-Ni-based thin films.
@en
In situ synchrotron X-ray diff ...... our in Ti-Ni-based thin films.
@nl
type
label
In situ synchrotron X-ray diff ...... our in Ti-Ni-based thin films.
@en
In situ synchrotron X-ray diff ...... our in Ti-Ni-based thin films.
@nl
prefLabel
In situ synchrotron X-ray diff ...... our in Ti-Ni-based thin films.
@en
In situ synchrotron X-ray diff ...... our in Ti-Ni-based thin films.
@nl
P2093
P1476
In situ synchrotron X-ray diff ...... our in Ti-Ni-based thin films.
@en
P2093
Guangai Sun
Guoqiang Pan
Liusi Sheng
Xiaolin Wang
Xiaotao Zu
Yanping Liu
Yaoguang Liu
Yong Qing Fu
P356
10.1107/S1600577514021031
P50
P577
2015-01-01T00:00:00Z