Using post-breakdown conduction study in a MIS structure to better understand the resistive switching mechanism in an MIM stack.
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Using post-breakdown conduction study in a MIS structure to better understand the resistive switching mechanism in an MIM stack.
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2011 nî lūn-bûn
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2011年の論文
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2011年学术文章
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Using post-breakdown conductio ...... ing mechanism in an MIM stack.
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Using post-breakdown conductio ...... ing mechanism in an MIM stack.
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Using post-breakdown conductio ...... ing mechanism in an MIM stack.
@en
Using post-breakdown conductio ...... ing mechanism in an MIM stack.
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Using post-breakdown conductio ...... ing mechanism in an MIM stack.
@en
Using post-breakdown conductio ...... ing mechanism in an MIM stack.
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P2093
P356
P1433
P1476
Using post-breakdown conductio ...... ing mechanism in an MIM stack.
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P2093
Gang Zhang
Kin-Leong Pey
Michel Bosman
Nagarajan Raghavan
Wen-Hu Liu
P304
P356
10.1088/0957-4484/22/45/455702
P50
P577
2011-10-13T00:00:00Z