Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy.
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A 17 GHz molecular rectifier.Cross-conjugation and quantum interference: a general correlation?Probing Frontier Orbital Energies of {Co9(P2W15)3} Polyoxometalate Clusters at Molecule-Metal and Molecule-Water Interfaces.Conductive probe AFM study of Pt-thiol and Au-thiol contacts in metal-molecule-metal systems.The study of charge transport through organic thin films: mechanism, tools and applications.Transition from direct tunneling to field emission in metal-molecule-metal junctions.Why one can expect large rectification in molecular junctions based on alkane monothiols and why rectification is so modest.A statistical method for determining intrinsic electronic transport properties of self-assembled alkanethiol monolayer devices
P2860
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P2860
Analysis of the causes of variance in resistance measurements on metal-molecule-metal junctions formed by conducting-probe atomic force microscopy.
description
2005 nî lūn-bûn
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2005年の論文
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2005年学术文章
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2005年学术文章
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2005年学术文章
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@zh-hans
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@yue
2005年學術文章
@zh-hant
name
Analysis of the causes of vari ...... probe atomic force microscopy.
@en
Analysis of the causes of vari ...... probe atomic force microscopy.
@nl
type
label
Analysis of the causes of vari ...... probe atomic force microscopy.
@en
Analysis of the causes of vari ...... probe atomic force microscopy.
@nl
prefLabel
Analysis of the causes of vari ...... probe atomic force microscopy.
@en
Analysis of the causes of vari ...... probe atomic force microscopy.
@nl
P2093
P356
P1476
Analysis of the causes of vari ...... probe atomic force microscopy.
@en
P2093
C Daniel Frisbie
Jeremy M Beebe
Vincent B Engelkes
P304
16801-16810
P356
10.1021/JP052348S
P407
P577
2005-09-01T00:00:00Z