Exposure assessment for retrospective follow-up studies of semiconductor- and storage device-manufacturing workers.
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Retrospective assessment of exposure to chemicals for a microelectronics and business machine manufacturing facilityExposure Reconstruction and Risk Analysis for Six Semiconductor Workers With Lymphohematopoietic CancersCancer incidence among semiconductor and electronic storage device workers.Cancer mortality and incidence in korean semiconductor workers.Cancer mortality in IBM Endicott plant workers, 1969-2001: an update on a NY production plant.Cancer and reproductive risks in the semiconductor industry.The role of exposure reconstruction in occupational human health risk assessment: current methods and a recommended framework.A model to systematically employ professional judgment in the Bayesian Decision Analysis for a semiconductor industry exposure assessment.IBM, Elsevier Science, and academic freedom.Review for Retrospective Exposure Assessment Methods Used in Epidemiologic Cancer Risk Studies of Semiconductor Workers: Limitations and Recommendations
P2860
Q23912155-C6F73CC8-ECC9-43F0-A107-38B1CFB0FD91Q28395142-5B6423DF-9052-44DA-A593-804C025FDCFFQ36166590-924C429C-E998-4C26-AA2D-F78A8B7DDF70Q36202598-984505C9-FA9B-460B-90F4-AB8D8875C0F5Q36657322-91766B43-D38D-4F3D-A7D4-9295B774C0F8Q37034120-2408EFAB-F755-47A4-B8B9-74014FF104D2Q37781049-731AD308-4162-41B5-A417-C6988B9CC497Q38166069-9A78FE21-514F-4686-A01F-BBFDD84CECD1Q53174030-D9A95A86-0922-469B-99E0-789B0904E2AFQ58129112-4BDB442F-6A03-4377-AA90-331D4931C23E
P2860
Exposure assessment for retrospective follow-up studies of semiconductor- and storage device-manufacturing workers.
description
2005 nî lūn-bûn
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2005年の論文
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2005年学术文章
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name
Exposure assessment for retros ...... device-manufacturing workers.
@en
Exposure assessment for retros ...... device-manufacturing workers.
@nl
type
label
Exposure assessment for retros ...... device-manufacturing workers.
@en
Exposure assessment for retros ...... device-manufacturing workers.
@nl
prefLabel
Exposure assessment for retros ...... device-manufacturing workers.
@en
Exposure assessment for retros ...... device-manufacturing workers.
@nl
P2093
P921
P1476
Exposure assessment for retros ...... device-manufacturing workers.
@en
P2093
Colleen Beall
Drew Blicharz
Elizabeth Delzell
Hong Cheng
James H Stewart
Nalini Sathiakumar
Robert F Herrick
Robert Matthews
Thomas Bender
P2880
P304
P356
10.1097/01.JOM.0000177128.50822.01
P407
P577
2005-10-01T00:00:00Z