Note: fast and reliable fracture strain extraction technique applied to silicon at nanometer scale.
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Note: fast and reliable fracture strain extraction technique applied to silicon at nanometer scale.
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2011 nî lūn-bûn
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2011年の論文
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2011年学术文章
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2011年学术文章
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2011年学术文章
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2011年学术文章
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2011年学术文章
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2011年学术文章
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2011年學術文章
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2011年學術文章
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Note: fast and reliable fractu ...... to silicon at nanometer scale.
@en
Note: fast and reliable fractu ...... to silicon at nanometer scale.
@nl
type
label
Note: fast and reliable fractu ...... to silicon at nanometer scale.
@en
Note: fast and reliable fractu ...... to silicon at nanometer scale.
@nl
prefLabel
Note: fast and reliable fractu ...... to silicon at nanometer scale.
@en
Note: fast and reliable fractu ...... to silicon at nanometer scale.
@nl
P2093
P2860
P356
P1476
Note: fast and reliable fractu ...... to silicon at nanometer scale
@en
P2093
Bengt Nilsson
Goran Petersson
Jean-Pierre Raskin
Mats Hagberg
Thomas Pardoen
Ulf Sodervall
Vikram Passi
P2860
P304
P356
10.1063/1.3655464
P577
2011-11-01T00:00:00Z