Angular dependence of dose sensitivity of surface diodes.
about
Surface dose measurements with commonly used detectors: a consistent thickness correction method.MapCHECK used for rotational IMRT measurements: Step-and-shoot, Tomotherapy, RapidArc.LabVIEW-based control and acquisition system for the dosimetric characterization of a silicon strip detector.The feasibility study and characterization of a two-dimensional diode array in "magic phantom" for high dose rate brachytherapy quality assurance.Angular independent silicon detector for dosimetry in external beam radiotherapy.Validation of OSLD and a treatment planning system for surface dose determination in IMRT treatments.In vivo measurements for high dose rate brachytherapy with optically stimulated luminescent dosimeters.A comprehensive comparison study of three different planar IMRT QA techniques using MapCHECK 2.Application of spherical diodes for megavoltage photon beams dosimetry.Interplay effect of angular dependence and calibration field size of MapCHECK 2 on RapidArc quality assurance.Development of a silicon diode detector for skin dosimetry in radiotherapy.Technical Note: Angular dependence of a 2D monolithic silicon diode array for small field dosimetry.A planning and delivery study of a rotational IMRT technique with burst delivery.Quality assurance measurements for high-dose-rate brachytherapy without film.Dependency of planned dose perturbation (PDP) on the spatial resolution of MapCHECK 2 detectors.Measurement comparison and Monte Carlo analysis for volumetric-modulated arc therapy (VMAT) delivery verification using the ArcCHECK dosimetry system.In vivo dosimetry with optically stimulated luminescent dosimeters, OSLDs, compared to diodes; the effects of buildup cap thickness and fabrication material.Calibration of a novel four-dimensional diode array.A comprehensive comparison study of three different planar IMRT QA techniques using MapCHECK 2.The use of a silicon strip detector dose magnifying glass in stereotactic radiotherapy QA and dosimetryA silicon strip detector dose magnifying glass for IMRT dosimetry
P2860
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P2860
Angular dependence of dose sensitivity of surface diodes.
description
2009 nî lūn-bûn
@nan
2009年の論文
@ja
2009年学术文章
@wuu
2009年学术文章
@zh
2009年学术文章
@zh-cn
2009年学术文章
@zh-hans
2009年学术文章
@zh-my
2009年学术文章
@zh-sg
2009年學術文章
@yue
2009年學術文章
@zh-hant
name
Angular dependence of dose sensitivity of surface diodes.
@en
Angular dependence of dose sensitivity of surface diodes.
@nl
type
label
Angular dependence of dose sensitivity of surface diodes.
@en
Angular dependence of dose sensitivity of surface diodes.
@nl
prefLabel
Angular dependence of dose sensitivity of surface diodes.
@en
Angular dependence of dose sensitivity of surface diodes.
@nl
P2860
P356
P1433
P1476
Angular dependence of dose sensitivity of surface diodes.
@en
P2093
Paul A Jursinic
P2860
P304
P356
10.1118/1.3125644
P407
P577
2009-06-01T00:00:00Z