Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers.

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Depth profiling cross-linked poly(methyl methacrylate) films: a time-of-flight secondary ion mass spectrometry approach.

P2860

Q48052497-468BA78B-AEC3-4953-8628-8C3AD10933B9

P2860

Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers.

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http://www.wikidata.org/entity/Q53298882

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2015 nî lūn-bûn

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2015年の論文

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2015年学术文章

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2015年学术文章

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Nitric oxide assisted C60 seco ...... f polyelectrolyte multilayers.

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Nitric oxide assisted C60 seco ...... f polyelectrolyte multilayers.

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type

Item

label

Nitric oxide assisted C60 seco ...... f polyelectrolyte multilayers.

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Nitric oxide assisted C60 seco ...... f polyelectrolyte multilayers.

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Nitric oxide assisted C60 seco ...... f polyelectrolyte multilayers.

@en

Nitric oxide assisted C60 seco ...... f polyelectrolyte multilayers.

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P1476

Nitric oxide assisted C60 seco ...... of polyelectrolyte multilayers

@en

P2093

A Torrisi

http://www.w3.org/2001/XMLSchema#string

G Zappalà

http://www.w3.org/2001/XMLSchema#string

V Motta

http://www.w3.org/2001/XMLSchema#string

P2860

ToF-SIMS Depth Profiling of Organic Films: A Comparison between Single Beam and Dual-beam Analysis.

Cluster secondary ion mass spectrometry and the temperature dependence of molecular depth profiles

Molecular ion imaging and dynamic secondary ion mass spectrometry of organic compounds.

Seduction of Finding Universality in Sputtering Yields Due to Cluster Bombardment of Solids.

Sample cooling or rotation improves C60 organic depth profiles of multilayered reference samples: results from a VAMAS interlaboratory study.

Improving secondary ion mass spectrometry C60(n+) sputter depth profiling of challenging polymers with nitric oxide gas dosing.

Depth profiling of metal overlayers on organic substrates with cluster SIMS.

Patterned polyelectrolyte multilayer: surface modification for enhancing selective adsorption.

Layered hydrogen-bonded nucleotide-functionalized CdS nanoparticles for photoelectrochemical applications.

On Universality in Sputtering Yields Due to Cluster Bombardment.

P304

2204-2210

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P31

scholarly article

P356

10.1002/RCM.7383

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P433

http://www.w3.org/2001/XMLSchema#string

P478

http://www.w3.org/2001/XMLSchema#string

P50

Nunzio Tuccitto

Stefania Vitale

A Licciardello

P577

2015-12-01T00:00:00Z

http://www.w3.org/2001/XMLSchema#dateTime

P698

26522311

http://www.w3.org/2001/XMLSchema#string

Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers.

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P2860

P2860

Nitric oxide assisted C60 secondary ion mass spectrometry for molecular depth profiling of polyelectrolyte multilayers.

description

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P1433

P1476

P2093

P2860

P304

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P356

P433

P478

P50

P577

P698

P356

P1433

P1476

P2093

P2860

P304

P31

P356

P433

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P577

P698