about
Photon-induced near-field electron microscopy.Optomechanical and crystallization phenomena visualized with 4D electron microscopy: interfacial carbon nanotubes on silicon nitride.Plasma formation and temperature measurement during single-bubble cavitation.Four-Dimensional Ultrafast Electron Microscopy: Insights into an Emerging Technique.Spatiotemporal Evolution of Coherent Elastic Strain Waves in a Single MoS2 Flake.Extreme conditions during multibubble cavitation: Sonoluminescence as a spectroscopic probe.Inside a collapsing bubble: sonoluminescence and the conditions during cavitation.Nanomechanical motions of cantilevers: direct imaging in real space and time with 4D electron microscopy.Non-Boltzmann Population Distributions during Single-Bubble SonoluminescenceTemperature Nonequilibration during Single-Bubble SonoluminescenceEmission from Electronically Excited Metal Atoms during Single-Bubble SonoluminescenceMeasurement of Pressure and Density Inside a Single Sonoluminescing BubblePlasma Quenching by Air during Single-Bubble SonoluminescencePlasma Line Emission during Single-Bubble CavitationThe Chemical History of a BubbleInfluence of Discrete Defects on Observed Acoustic-Phonon Dynamics in Layered Materials Probed with Ultrafast Electron MicroscopyObservation of Anisotropic Strain-Wave Dynamics and Few-Layer Dephasing in MoS2 with Ultrafast Electron MicroscopyReducing Radiation Damage in Soft Matter with Femtosecond-Timed Single-Electron PacketsImaging phonon dynamics with ultrafast electron microscopy: Kinematical and dynamical simulations
P50
Q33519003-F57C2448-264F-4282-ADDD-B8337F4674E5Q33550921-D8F74767-389F-4F71-8F95-643CD5724179Q34399684-3302BD8B-B0DF-4988-95E6-600934B28D16Q36224490-620806EF-1F40-44B2-B0F3-EE448646A16EQ36373100-B90B1721-3285-47CA-A2CA-C99D26754354Q37830144-8D314052-6C37-429E-8698-0006A591F718Q42696166-87A9D249-C9DB-45D2-882D-E7831F746A32Q46355894-231E3484-3445-4466-B1B9-8C619B443959Q62508120-5DFC9584-F7C6-45C0-8AFE-C679453C0CD8Q62508135-B0E14865-A27F-4380-B14B-381FC2978B65Q62508278-3C72E1FE-4C89-4F3E-971A-937428741CA2Q62508338-82299D6B-3F69-4318-AA3F-A23786909833Q62508355-BFB01996-F112-4CF3-A37D-5B180E8C0150Q62508415-6132C811-E3D3-49D9-A898-A804428716FAQ88711053-7ED2DA88-E526-4F3E-A792-26709EA08821Q89754190-7748D8FF-AE53-42DC-ACF0-DD9C0063D92BQ90973416-5DD976E6-7CB6-4B25-9B27-73085DB67415Q92746154-F6FF4896-A73D-4F21-9124-738238998889Q93272926-D29400D2-0334-4F71-BA96-9F52065A05CD
P50
description
onderzoeker
@nl
researcher
@en
հետազոտող
@hy
name
David J Flannigan
@ast
David J Flannigan
@en
David J Flannigan
@es
David J Flannigan
@nl
David J Flannigan
@sl
type
label
David J Flannigan
@ast
David J Flannigan
@en
David J Flannigan
@es
David J Flannigan
@nl
David J Flannigan
@sl
prefLabel
David J Flannigan
@ast
David J Flannigan
@en
David J Flannigan
@es
David J Flannigan
@nl
David J Flannigan
@sl
P106
P21
P31
P496
0000-0002-1829-1868